TERS and TEPL for materials research
Tip-Enhanced Raman Spectroscopy (TERS) is a cutting-edge technique revolutionizing nanoscale analysis. By integrating Raman spectroscopy with scanning probe microscopy, TERS offers unparalleled sensitivity and resolution, enabling the study of individual molecules with astonishing detail. With its ability to probe chemical composition, structure, and dynamics at the nanoscale, TERS holds immense promise for applications in fields ranging from materials science to biomedical research.
FEATURES:
AFM provides:
- Topography
- Adhesion / stiffness
- Surface potential
- Conductivity
- Capacitance ( charge carrier concentration)
- Photocurrent
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Optical spectroscopy:
- Structure, defects (Raman)
- Electronic band structure (PL)
- Mechanical strain (Raman peaks shift)
- Doping (PL and Raman)
- Photocurrent
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Available lasers for TERS & TEPL:
532, 473, 633,785